The Principles of Dynamic SIMS - Webinar

星期五, 一月 3, 2020

This free on-demand webinar is an excellent introduction to the dynamic SIMS technique. Different practical aspects are discussed:
  • Choice of primary and secondary beam species
  • Relative sensitivity for various elements
  • Matrix effects
  • Depth resolution & Lateral resolution
  • Depth profiling (choice of impact energy & sputtering rate, calibration method)
  • Scanning ion imaging mode
A summary of dynamic SIMS main analytical characteristics is provided at the end.

Presenter: Dr Paula Peres, CAMECA SIMS Product Manager
Duration: 20 minutes

Attend the webinar at any time