Offering high spatial resolution (50nm) together with ultra-high sensitivity for localized isotope ratio or trace element analysis, the NanoSIMS 50L is the tool of choice for two- and three-dimensional hydrogen imaging as well as hydrogen depth profiling from areas of few microns.
This application note reviews recent fundamental material research supported by NanoSIMS:
- Study of zirconium alloy oxidation using 2H and 18O tracers
- Researching hydrogen trapping at second phase particles in Zr alloys
- Investigating the role of precipitates in hydrogen trapping and hydrogen embrittlement of a nickel-based superalloy
- Identifying lithium and hydrogen diffusion pathways in lithium aluminate pellets
- Revealing hydrogen enrichment at grain boundaries in plasma-facing materials
Download the application note
SIMS for Hydrogen & Deuterium Analysis to learn more!
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