参加我们的免费研讨会，了解元素分析、高分辨率成像以及用于研究和过程控制的材料表征新分析方法方面的领军人物。聆听来自马克斯-普朗克科学促进会、弗莱堡大学和其他机构的研究人员如何利用质谱法（APT 和 SIMS）和电子显微镜法（SEM 和 TEM）推进从
冶金到
半导体的研究。
📍 会场: AMETEK GmbH, Rudolf-Diesel-Straße 16, 64331 Weiterstadt, Germany
📆 日期: 2025 年 6 月 3 日，星期二
研讨会为期一天，各个水平均可参加，并有充足的时间与来自 CAMECA、Gatan 和 EDAX 的专家进行交流。
🚩日程
| Time |
Title |
Speaker |
Speaker Affiliation |
| 9:30 – 10:00 |
Welcome and introduction |
Wiebke Rumpf |
AMETEK GmbH |
| 10:00 – 10:30 |
Improving materials characterization by advanced EBSD analysis |
Dr. René de Kloe |
EDAX (now part of Gatan) |
| 10:30 – 11:00 |
Quantum leaps in EBSD analysis |
Dr. Stefan Zaefferer |
Department of Microstructure Physics and Alloy Design, Max Planck Institute for Sustainable Materials |
| 11:00– 11:30 |
Coffee break |
| 11:30– 12:00 |
Correlative APT-EBSD studies on energy materials |
Prof. Dr. Oana
Cojocaru-Mirédin |
INATECH, Albert Ludwig University of Freiburg |
| 12:00 – 12:30 |
The TOMO project– Integrating a fully functional atom probe in an abberation-corrected TEM |
Prof. Dr. Joachim Mayer |
Ernst Ruska – Centre for Microscopy and Spectroscopy with Electrons (ER-C) |
| 12:30– 13:30 |
Lunch |
| 13:30 – 14:00 |
SIMS in material science: An introduction to analyzing thin films, nanostructures & more |
Dr. Stephanie Reiß |
CiS Forschungsinstitut für Mikrosensorik GmbH – CiS Analytics Competence Center CAK |
| 14:00– 14:30 |
Cryo-APT opens up new possibilities in materials analysis |
Dr. Tim Schwarz |
Department of Microstructure Physics and Alloy Design, Max Planck Institute for Sustainable Materials |
| 14:30– 15:00 |
Coffee break |
| 15:00– 15:30 |
Quantitative EPMA and SIMS analysis for industrial coatings |
Dr. Kirsten Schiffmann |
Head of Department Analytics and Quality Assurance,
Fraunhofer Institute for Surface Engineering and Thin Films IST |
| 15:30– 16:00 |
Micro- and nanoscale characterization using APT and SIMS |
Dr. René Chemnitzer |
CAMECA |
| 16:00 |
Hors d'œuvres and drinks
|