Join us for a free workshop showcasing thought leaders in elemental analysis, high-resolution imaging, and new analytical methods for characterizing materials for research and process control. Hear how researchers from the Max Planck Society for the Advancement of Science, University of Freiburg, and others have used mass spectrometry (APT and SIMS) and electron microscopy (SEM and TEM) to advance their research ranging from
metallurgy to
semiconductors.
📍 Venue: AMETEK GmbH, Rudolf-Diesel-Straße 16, 64331 Weiterstadt, Germany
📆 Date: Tuesday, June 3
rd, 2025
This one-day workshop is open to novice and expert users alike and will include ample time for networking with experts from CAMECA, Gatan, and EDAX.
Registration, lunch, and refreshments for this in-person event are free, but seats are limited.
Register today to secure your spot!
REGISTER
🚩Agenda
| Time |
Title |
Speaker |
Speaker Affiliation |
| 9:30 – 10:00 |
Welcome and introduction |
Wiebke Rumpf |
AMETEK GmbH |
| 10:00 – 10:30 |
Improving materials characterization by advanced EBSD analysis |
Dr. René de Kloe |
EDAX (now part of Gatan) |
| 10:30 – 11:00 |
Quantum leaps in EBSD analysis |
Dr. Stefan Zaefferer |
Department of Microstructure Physics and Alloy Design, Max Planck Institute for Sustainable Materials |
| 11:00– 11:30 |
Coffee break |
| 11:30– 12:00 |
Correlative APT-EBSD studies on energy materials |
Prof. Dr. Oana
Cojocaru-Mirédin |
INATECH, Albert Ludwig University of Freiburg |
| 12:00 – 12:30 |
The TOMO project– Integrating a fully functional atom probe in an abberation-corrected TEM |
Prof. Dr. Joachim Mayer |
Ernst Ruska – Centre for Microscopy and Spectroscopy with Electrons (ER-C) |
| 12:30– 13:30 |
Lunch |
| 13:30 – 14:00 |
SIMS in material science: An introduction to analyzing thin films, nanostructures & more |
Dr. Stephanie Reiß |
CiS Forschungsinstitut für Mikrosensorik GmbH – CiS Analytics Competence Center CAK |
| 14:00– 14:30 |
Cryo-APT opens up new possibilities in materials analysis |
Dr. Tim Schwarz |
Department of Microstructure Physics and Alloy Design, Max Planck Institute for Sustainable Materials |
| 14:30– 15:00 |
Coffee break |
| 15:00– 15:30 |
Quantitative EPMA and SIMS analysis for industrial coatings |
Dr. Kirsten Schiffmann |
Head of Department Analytics and Quality Assurance,
Fraunhofer Institute for Surface Engineering and Thin Films IST |
| 15:30– 16:00 |
Micro- and nanoscale characterization using APT and SIMS |
Dr. René Chemnitzer |
CAMECA |
| 16:00 |
Hors d'œuvres and drinks
|