The Dynamic SIMS (Secondary Ion Mass Spectrometry) technique is routinely used for a variety of nuclear science and engineering applications.
Download our application notes to learn more:
> SIMS for Materials Analysis in Nuclear Science
> SIMS Applications to Nuclear Science: Fission Products Behavior
> Radiation Protection: Intracellular uranium detection with SIMS
Offering extreme sensitivity, high depth and lateral resolution together with high throughput, Dynamic SIMS can be applied to:
> Characterization of plasma facing materials in fusion devices
> Control of thermal and irradiation effects on fission products
> Investigation of long-term behavior of nuclear materials for safe waste disposal
> Study of uranium accumulation processes in human tissues and cells,
and more!