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  • simultaneous apt
    Simultaneous Voltage and Laser Pulsing in APT

    星期二, 十月 17, 2023

    Speaker : Robert Ulfig, Senior Product Manager at CAMECA

    Simultaneous voltage and laser pulsing (VpL) in atom probe tomography has been shown to improve spectral quality, improve detection sensitivity and improve specimen yield. This webinar will discuss the enabling technologies, discuss the optimization process for maximizing experimental success and give examples of applications that benefit from this new feature of the LEAP 6000

    View this short webinar with a Q&A session↓ ON DEMAND HERE

  • probing nanoscale
    Cryogenic Sample Preparation, Transfer and Analysis for Site-specific APT of Frozen Materials

    星期二, 八月 15, 2023

    Speaker : Dr. James O. Douglas, Research Facility Manager at Imperial College London

    Cryogenic sample preparation, cryogenic-vacuum sample transfer and cryogenic analysis have become of increasing interest to the electron microscopy and atom probe tomography communities. Cryogenic workflows open up the application of APT to the analysis of beam sensitive materials, frozen liquids, frozen liquid/solid interfaces and mobile elements such as hydrogen/deuterium.
    Through the integration of multiple high resolution cryogenic microscopy techniques, we can characterize the structure and composition of environmentally-sensitive materials systems across multiple length scales. There are significant challenges in the sample preparation, transfer and analysis of such materials compared to those at room temperature, and optimizing each of these stages is crucial to reproducible protocols.
    In this webinar, we discuss these challenges in detail and present our progress in developing and implementing cryogenic workflows for site-specific lift out for APT analysis.

    View this short webinar with a Q&A session↓ ON DEMAND HERE

  • APT advanced
    Atom Probe Tomography of Advanced Structural Materials for Conventional and Additive Manufacturing at NUCAPT

    星期二, 六月 20, 2023

    Speaker : Amir R. Farkoosh, Post-Doctoral Researcher, Northwestern University

    This presentation will provide an overview of various alloy design activities at Northwestern University enabled by atom-probe tomography (APT), specifically the LEAP 5000XS instrument available at the Northwestern University Center for Atom-Probe Tomography (NUCAPT). We combine microstructural and chemical information obtained on a sub-nanoscale by APT with results from other advanced characterization tools and theoretical methods (Ab initio and CALPHAD thermodynamic calculations and strength modeling) to design and study structure and properties of new alloys for conventional and additive manufacturing processes. Specific focus is given to high-temperature aluminum alloys and high-strength steels, showcasing our innovative design and characterization approaches.

    ↓ ON DEMAND HERE

  • revealing nanoscale apt
    Revealing Nanoscale Atom Distributions in Zeolite Catalysts with Atom Probe Tomography at ORNL

    星期二, 六月 13, 2023

    Speaker : Jon Poplawsky, Senior Research Staff at Oak Ridge National Laboratory

    Within the last decade, APT has proven to be a useful technique for zeolite analysis, and several studies have shed light upon their atomistic activation and degradation mechanisms [1-11]. For example, coke molecules in ZSM-5, SSZ-13, and SAPO-34 have been spatially linked to active catalysis lattice sites which degrades the catalytic performance [2, 3, 5, 7, 9]. In addition, APT data revealed why Cu-exchanged SSZ-13 outperforms Cu-exchanged ZSM-5 for NOx diesel exhaust reduction in both conversion rate and longevity [10]. Although most of the experiments were run at ORNL with a LEAP 4000XHR (3.4 eV laser), fresh and methanol reacted ZSM-5 zeolites were recently run in a LEAP 6000XR at CAMECA with a 4.7 eV laser, which has shown promising yield results.

    ↓ ON DEMAND HERE

  • APT alloys and steels
    Atom Probe of Alloys and Steels on the Invizo 6000, LEAP4000X Si, and LEAP3000 Si: The University of Sydney

    星期二, 五月 23, 2023

    Speaker : Levi Tegg, Postdoctoral Research Associate at The University of Sydney

    The University of Sydney recently installed the first Cameca Invizo 6000 atom probe. The ion optics of this instrument differ significantly from those of a local electrode atom probe (LEAP), leading to some differences in the typical instrument operation and the resulting reconstructions. This presentation will review some experiments performed by our researchers in comparing the Invizo 6000 to our LEAP4000X Si and LEAP3000 using case studies of selected alloys.

    ↓ ON DEMAND HERE

  • stress corrosion apt
    Perspectives on APT Characterisation of Materials for Nuclear Energy Applications

    星期二, 三月 21, 2023

    Speaker : Dr. Michael Moody, Professor of Materials at Oxford University

    This presentation will briefly introduce a variety of research themes undertaken at the newly established Nuclear Materials Atom Probe (NuMAP) Facility at the University of Oxford, including: hydrogen pick-up in zirconium alloys for fuel cladding, the clustering of transmuted atoms in tungsten fusion reactor components, stress corrosion cracking in stainless steel, and the embrittling effects of irradiation on reactor pressure vessel steels. In particular, it will highlight the invaluable atomic-scale materials insights provided by APT.

    ↓ ON DEMAND HERE

  • APT webinar
    Probing Nanoscale Dopant Distributions within Silicon Carbide Power Devices using APT

    星期二, 二月 21, 2023

    Speaker : Dr. Ramya Cuduvally Manohar, Postdoctoral Fellow at McMaster University

    The electronic/material properties of silicon carbide, namely its high thermal conductivity, wide bandgap, high breakdown electric field and high electron saturation drift velocity, make it an attractive choice for power devices where high voltage, high temperature and high frequency operation are crucial. However, SiC devices are more challenging to fabricate compared to their Si counterparts. Incorporating dopants within SiC is particularly challenging because of the poor diffusivity of dopant atoms in this material. This necessitates the use of ion implantation, which must then be followed by a high temperature (>1500°C) anneal to electrically activate the dopant and repair the lattice. The ion implantation process together with the high temperature anneal can potentially induce structural changes within SiC and ultimately impact device performance. In this work, we characterize the dopant distribution within SiC junction field effect transistors (JFETs) using atom probe tomography. We show that the 3D distribution of the p-type dopant is extremely inhomogeneous within the gate diffusion region of the JFET and discuss the possible implications of this finding for device performance. We also discuss some of the challenges encountered during the APT analysis with respect to dopant quantification and focused ion beam sample preparation. Overall, we demonstrate the importance of APT for reliability and variability studies of semiconductor devices.

    ↓ ON DEMAND HERE

  • Quantification of Mass Spectrum Data in Atom Probe Tomography
    Quantification of Mass Spectrum Data in APT

    星期三, 二月 1, 2023

    Speaker : David Saxey, Curtin University

    Tuesday, February 21, 10AM CST

    For some applications of Atom Probe Tomography (APT) accurate chemical or isotopic quantification is major objective. While there are limitations in the quantitative analysis of samples by APT, there are also ways to mitigate these limitations by optimising the acquisition conditions, or by considering the most appropriate methods for data analysis. This webinar will discuss the challenges of quantifying the peaks in APT mass spectrum data, covering aspects such as ranging and peak shape considerations, and reviewing some recent results in this area. In particular, examples will be given from isotope geochemistry, where the accuracy of isotopic quantification is especially important, and where comparisons can be made with well-established reference materials.

    View this short webinar with a Q&A session↓ REGISTERE HERE